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[摘要]
在模拟阵列近场测试基础上,对全自适应数字阵列的近场测试进行研究,结合全自适应数字阵列的特点,采用多通道并行处理等技术,对近场测试系统进行全面升级,从而解决全自适应数字阵列的测试难题。另外,为了解决干扰抑制零深评估的难题,采用改进后的近场测试系统,对自适应响应波束进行测试,从而得到真实的干扰抑制零深。仿真和实验结果表明,改进后的近场测试系统能完成全自适应数字阵列测试,从而实现了对全自适应数字阵列的全面评估。
[Key word]
[Abstract]
On the basis of near-field measurement for analog array,this paper studies near field measurement of all adaptive digital array, combining with the feature of all adaptive digital array, adopts multichannel parallel process technology ,and improves measure system, so as to solve measure question. In order to estimate the null level of jam suppression, measures adaptive response pattern by improved measurement syetem, achieves the real null level of jam suppression. The result of simulation and experiment shows that adaptive digital array is estimated roundlyby improving measurement system and realizing the near field measurement of adaptive digital array.
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