随着T/ R 组件集成度的不断提升,氮化镓(GaN)功放载片因其输出功率大、效率高、体积小的特点,成为功率放大器发展中的一种新形态。文中研究了一种新型的GaN 功放载片可靠性和质量评价提升的方法,针对于GaN 功放载片的特点,该方法将微波单片和分立器件的评价方法相结合,关注功率管芯、匹配电容等可靠性核心元件,通过细化筛选试验、加严质量一致性评价,辅以加速寿命试验的方式,在早期剔除不良品,控制产品的技术状态,提升产品的可靠性。利用两型GaN 功放载片产品进行验证,两型产品在质量一致性评价时发现高功率管芯和匹配电容的问题,证明该方法可以显著提升GaN 功放载片的质量。

With the integration improvement the T/ R module, gallium nitride (GaN) die-packaged pallet power amplifier (DP PA) is becoming a new form duo to its high output power, high efficiency and compact size. In this article, a novel reliability and quality evaluate method is researched to adapt the new DP PA. Based on the characteristics of the GaN DP PA, the researched method combines the evaluate method of the monolithic microwave integrated circuit and discrete device and focuses on the core elements, such as high power die and matching capacitance. By detailing the screening test, tighten the consistency of quality evaluation and accelerated life tests, the unaccepted products can be filtrated in early stage and the quality state can be controlled. In that way, the reliability of the products can be improved. Two GaN DP PA products are utilized to validate the researched method. In the consistency of quality evaluation, the quality issues of the high power die and matched capacitance are found in these two products. The two samples demonstrate the proposed method can significantly enhance the quality of the GaN DP PA.

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